Researchers in electrical and computer engineering earn IEEE Best Paper Award
Researchers in electrical and computer engineering at Auburn University have shown that data—sometimes sensitive information—is not lost when static random access memory, or SRAM, also known as a semi-conductor memory, is powered off. Instead, data written to SRAM chips is permanently stored and can be partially retrieved.
“Strong consideration must be taken by industry and defense before throwing them out,” said Ujjwal Guin, assistant professor in electrical and computer engineering. “This information can be very sensitive if the chip has been used in a critical application and can be important to an adversary. “As aging permanently leaves an impression on the power-up state, we knew we could recover old data, and we begin to explore how to do that.”
Submitted by: Joe McAdory